INTERSIL CORPORATION
| 1650 Robert J. Conlan Blvd.
|
Palm Bay, FL USA 32905
|
Tel ep ho ne 32 1-724-7000
|
www.intersil.com
PRODUCT
ADVISORY
Data Sheet Specification
Correction for Intersil
Products ISL89166*,
ISL89167*, and ISL89168*
Refer to:
PA13017
Date: February 26, 2013
INTERSIL CORPORATION
| 1650 Robert J. Conlan Blvd.
|
Palm Bay, FL USA 32905
|
Tel ep ho ne 32 1-724-7000
|
www.intersil.com
February 26, 2013
To: Our Valued Intersil Customers
Subject: Data Sheet Specification Correction for Intersil Products ISL89166*, ISL89167*, and
ISL89168*
This advisory is to inform you that Intersil has updated the data sheet specification for the
ISL89166*, ISL89167*, and ISL89168* products. The update corrects an error in the value listed
for Charged Device Model (CDM) under the ESD Ratings section on page 4 of the data sheet. Details
regarding the change are contained on the following page. The updated data sheet is available on
the Intersil web site at
http://www.intersil.com/content/dam/Intersil/documents/fn77/fn7720.pdf.
Products affected:
ISL89166FBEAZ ISL89166FRTAZ-T ISL89167FRTAZ ISL89168FBEAZ-T
ISL89166FBEAZ-T ISL89167FBEAZ ISL89167FRTAZ-T ISL89168FRTAZ
ISL89166FRTAZ ISL89167FBEAZ-T ISL89168FBEAZ ISL89168FRTAZ-T
There have been no changes to the die/silicon or product itself. There will be no change in the
external marking of the packaged parts.
Intersil will take all necessary actions to conform to agreed upon customer requirements and to
ensure the continued high quality and reliability of Intersil products being supplied. Customers may
expect to continue receiving product processed to the same established conditions and systems
used for manufacturing of material supplied today.
If you have concerns with this advisory, Intersil must hear from you promptly. Please contact the
nearest Intersil Sales Office or call the Intersil Corporate line at 1-888-468-3774, in the United
States, or 1-321-724-7143 outside of the United States.
Regards,
Jon Brewster
Jon Brewster
Intersil Corporation PA13017
CC: J. Touvell G. Parker P. Muggler