Power Integrations - For Intended Use Only
Product Reliability Report
Scale-iDriver Family AEC-Q100 Automotive
Qualification Report
SIC1132KQ, SIC1152KQ, SIC1181KQ, SIC1182KQ
eSOP-R16B Package
Version 1.0 – October 25, 2019
Scale-iDriver AEC-Q100 Automotive Qual Report Page 2
Power Integrations - For Intended Use Only
Summary: The Scale-iDriver IC family consisting of the SIC1132KQ, SIC1152KQ and SIC1182KQ has been qualified for automotive
applications per the requirements of AEC-Q100 Rev H. These products consist of a common primary-side die and nearly identical
secondary-side die that differ only in their GH pin drive currents and GL pin sink currents, and thus differ in the size of their GH and GL
pin power-MOSFETs. The SIC1182KQ has the highest current capabilities in the family and thus the largest secondary-side die, so this
device was selected for qualification and the SIC1132KQ and SIC1152KQ are qualified by extension as specified per AEC-100 Rev H.
Qualification Results
Item
Stress Test per
AEC-Q100 Rev. H
Abbr.
Test Condition
Reference
Lab
#Lots
Sample
Size
#Failed
Results
Comments
A1
Pre-conditioning
PC
MSL3 (24 Hour
150°C Bake + 40
Hour 60°C/60%
R.H. Soak + 3X
260°C Reflow)
Applied to
THB/uHAST/TC/PT
C samples
JESD22
A-113; J-
STD-020
PISJ
3
Per
Tests
0 / 738
Passed
MSL3
A2
Temperature-
Humidity-Bias
THB
85°C / 85% R.H. for
1,000 Hours; 5
mins On and 5 mins
Off
JESD22
A-101
PISJ
3
77
0 / 230
1
Passed
note 1: one lot
had one unit got
damaged during
read point
testing due to
mishandling
A3
Unbiased HAST
UHST
110°C / 85% R.H.
for 264 Hours;
JESD22
A-118
EAG
3
77
0 / 231
Passed
A4
Temperature
Cycling
TC
-40°C / +125°C for
1,544 Cycles (Grade
1)
JESD22
A-104
PISJ
3
77
0 / 231
Passed
A5
Power
Temperature
Cycling
PTC
-40°C / +125°C for
1,000 Cycles (Grade
1)
5 mins On and 5
mins Off
JESD22
A-105
PISJ
1
45
0 / 45
Passed
A6
High Temperature
Storage Life
HTSL
150°C for 1,000
Cycles (Grade 1)
JESD22
A-103
PISJ
1
45
0 / 45
Passed
B1
High Temperature
Operating Life
HTOL
125°C Tj for 1,000
Hours (Grade 1)
JESD22
A-108
PISJ
3
77
0 / 231
Passed
B2
Early Life Failure
Rate
ELFR
125°C Tj for 48
Hours
AEC
Q100-008
PISJ
3
800
0 / 2400
Passed
B3
NVM Endurance,
Data Retention
EDR
AEC
Q100-005
N/A
Not applicable;
apply to NVM or
IC with OTP
memory only
C1
Wire Bond
Strength
WBS
30 bonds from a
minimum of 5 units
AEC
Q100-
001; AEC
Q003
UNISEM
3
30
0 / 90
Passed
For the 3 qual
lots:
1 mil wire: Cpk =
2.36, 2.20, 2.34;
2 mil wire: Cpk =
2.13, 2.18, 2.09.