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D9030DDRC DDR3 and LPDDR3

Compliance Test Application Software

The Keysight Technologies, Inc. DDR3 and LPDDR3 compliance test

application provides a fast and easy way to test, debug and

characterize your DDR3 and LPDDR3 designs. The tests performed by

the D9030DDRC software are based on the JEDEC DDR3 and

LPDDR3 Specification. In addition, the application features Custom

mode, which covers crucial measurements such as eye- diagram, mask

testing, ringing and other tests that are not covered in the specifications

but are critical for characterizing DDR3 and LPDDR3 devices. The test

application offers a user-friendly setup wizard and a comprehensive

report that includes margin analysis.

Features

• Setup wizard for quick setup, configuration and test selection.

• Execution speed and proven test algorithm which minimizes test time.

• User-select tests and configuration based on the JEDEC DDR3 and

LPDDR3 specification.

• Option to use phase difference or mixed signal oscilloscope read-

write command trigger allowing for robust read and write data

separation.

• Read and write cycle separation in real time mode for powerful debug

and analysis.

• Ability to analyze the loading effect of adjacent rank of the same

memory channel.

• DDR debug tool for navigation to areas of interest in a saved

waveform with pre and post compliance testing capability.

• Test framework that reports multi trial results with full array of

statistics for each measurement with worst case measurement result.

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Comprehensive Test Coverage

The DDR3 and LPDDR3 compliance test application automatically configures the oscilloscope for

each test and provides information test results which includes margin and statistical analysis. The

tests coverage includes electrical, timing and eye diagram tests as stated in the JEDEC

specification. The signal is optimized for most accurate test result and measurement repeatability.

If you discover a problem with your device, the Custom mode feature and debug tool are

available to aid in root-cause analysis.

Easy Test Definition

The test application enhances the usability of Keysight Infiniium oscilloscopes for testing DDR3

and LPDDR3 devices. The Keysight automated test framework guides you quickly through the

steps required to define the setup, perform the tests and view the test results. You have the

option to use the conventional DQS-DQ phase difference or MSOV logic triggering (used only

with MSOV series Infiniium oscilloscopes) for read and write data separation. You can select a

category of tests or select an individual test. The user interface is designed to minimize

unnecessary reconnections, which will help save test time and minimize potential operator error.

You can save the tests and configurations as project files and recall them for quick testing and

review previous results. You can also run the compliance test with saved waveform files from the

oscilloscope or the ADS simulation tool on your PC, freeing the oscilloscope for other data

acquisition purposes.

Figure 1. DDR3 and LPDDR3 application test setup screen. Select the speed grade of your device.