May 2021 United Silicon Carbide, Inc. 1
www.unitedsic.com
United Silicon Carbide, Inc.
AEC-Q101 Product Qualification Report
Discrete TO Packaged SiC Cascodes
Included Products:
TO-247-3L
TO-220-3L
TO-247-4L
UJ3C120150K3S
UJ3C065080T3S
UF3C120150K4S
UJ3C120080K3S
UF3C065040T3S
UF3C120080K4S
UJ3C120070K3S
UJ3C065030T3S
UF3C120040K4S
UJ3C120040K3S
UF3C065080T3S
UF3C065080K4S
UJ3C065080K3S
UF3C065030T3S
UF3C065040K4S
UF3C065040K3S
UF3C065030K4S
UJ3C065030K3S
UF3C065080K3S
UF3C065030K3S
UF3C120080K3S
UJ3C120040K3S
UF3C170400K3S
UF3C120400K3S
Product Qualification Report –Cascodes
May 2021 United Silicon Carbide, Inc. 2
www.unitedsic.com
Scope
This report summarizes the AEC-Q101 qualification results for the UJ3C and UF3C family
of discrete SiC Cascodes in TO-220-3L, TO-247-3L and TO-247-4L plastic packages.
The environmental stress tests listed below are performed with pre-stress and post-
stress electrical tests. Reviewing the electrical results for new failures and any significant
shift performance satisfies the AEC-Q101 qualification standards, as well as UnitedSiC
Quality requirements.
Reliability Stress Test Summary
Test Name Test Standard
# Samples
x # Lots
Failures
High Temperature
Reverse Bias
(HTRB)
MIL-STD-750-1
M1038 Method A
(1000 Hours)
T
J
=175
o
C, V=80% V
max
77x10 lots 0/770
High Temperature
Reverse Bias
(HTRB)
MIL-STD-750-1
M1038 Method A
(168Hours)
T
J
=175
o
C, V=80% V
max
77x4 lots 0/308
High Temperature
Gate Bias
(HTGB)
JESD22 A-108
(1000 Hours)
T
J
=175
o
C, V=100% V
max
(+25V), bias in on
direction
77x10 lots 0/770
Highly Accelerated
Stress Test
(HAST)
JESD22 A-110
(96 Hours)
T
A
=130
o
C/85%RH
77x8 lots 0/616
High Humidity,
High Temperature,
Reverse Bias
JESD22 A-110
(1000 Hours)
T= 85°C, 85% RH, V
GS
=0V, V
DS
=100V
77x3 lots 0/231
Intermittent
Operating Life
(IOL)
MIL-STD-750
Method 1037
DT
J
≥125ºC, 3000 cycles
(5 minutes on/ 5 minutes off)
77x10 lots 0/770