Reliability Handbook
Ver.2
December 2018
© 2017-2018 Toshiba Electronic Devices & Storage Corporation
2
© 2017-2018 Toshiba Electronic Devices & Storage Corporation
Chapter 1 Semiconductor Reliability
1-1. Reliability Concept ….............................................10
1-1-1. Defining and Quantifying Reliability …..............10
1-1-2. Reliability and Time ........................................11
1-1-2-1. Reliability (or Reliability Function) R(t)
1-1-2-2. Non-Reliability (or Cumulative Failure Distribution) F(t)
1-1-2-3. Failure Density Function ƒ(t)
1-1-2-4. (Instantaneous) Failure Rate (or Hazard Rate) (t)
1-1-2-5. Product Life
1-1-2-6. Distributions in Reliability Analysis
1-1-2-7. Continuous Distributions
1-1-2-8. Discrete Distributions
1-1-2-9. Bathtub Curve
1-1-2-10. Concept of Initial Failure Period’s Screening
1-1-2-11. System LSI Field Failure Mode
1-1-3. Operating and Environment Conditions ...........29
1-1-4. Designing Against External Stress ..................30
Table of Contents