Introduction

Evaluate all device parameters under a wide range of operating conditions

to improve power electronics circuit design performance

– Measures all IV parameters (Ron, BV, Leakage, Vth, Vsat, etc.)

– Measure transistor input, output and reverse transfer capacitances (Ciss, Coss, Crss, Cies, Coes,

Cres, Rg) at high bias voltages

– Qg curve measurement for Nch MOSFETs and IGBTs

– Power loss (conduction, driving and switching) evaluation

– Menu driven user interface specially designed for circuit designers (Easy Test Navigator - ETN)

– Quick and automatic device datasheet generation

– Data sheet characterization mode supports quick and easy evaluations of data sheet parameters

– WideoperationI/V(1500A,3kV)Thermaltest(−50to+250°C)

– Oscilloscope View provides visual verification of pulsed measurement waveforms

– Covers typical semiconductor devices and electronic components used in high power circuits

The B1506A Power Device Analyzer for Circuit Design is a complete solution that can help power

electronic circuit designers maximize the value of their power electronics products by enabling them to

select the correct power semiconductor devices and components for their applications. It can evaluate

all relevant device parameters under a wide range of operating conditions, including IV parameters

such as breakdown voltage and on-resistance, as well as three terminal FET capacitances, gate charge

and power loss.

The B1506A has a wide range of capabilities that help it identify substandard semiconductor devices

and components under actual circuit operating conditions, including a wide voltage and current range

(3kVand1500A),awidetemperaturemeasurementrange(-50to+250°C),fastpulsingcapability,

and sub-nA level current measurement capability. Its unique software interface , Easy Test Navigator,

presents the user with a familiar device data sheet format that makes it easy to characterize semi-

conductor devices and components without going through any formal training. Integrated switching

circuitry within the test fixture supports fully automated testing, with the ability to automatically change

between both high voltage and high current testing as well as between IV and CV measurements. In

addition, a unique plug-in style device test fixture socket adapter eliminates cable connection and other

human-related errors. The B1506A also supports the complete automation of thermal characterization.

This can be accomplished through the integrated Thermostream control. Since the DUT is in close

proximity to the B1506A’s measurement resources, the large parasitics caused by cable extensions

leading to a temperature chamber do not exist. For this reason, oscillation free ultra-high currents of up

to 1500 A can be accurately evaluated at both low and high temperature.

The B1506A’s capabilities revolutionize power electronics circuit design by both helping to maximize end

product value and accelerating product development cycles.