T4-LDS-0337-1, Rev. 1 (04/15/14) ©2014 Microsemi Corporation Page 1 of 8
MSR2N2222AUA
Rad Hard NPN Silicon Switching Transistor
Screened per MIL-PRF-19500 & ESCC 22900
Screened Levels:
MSR
QPL RANGE and RAD LE VEL
Radiation Level MSR2N2222AUA
UA Package
Also available in:
TO-206AA (TO-18)
package
(leaded top-hat)
MSR2N2221A(L)
UB package
(surface mount)
MSR2N2221AUB
TID
100 Krad
ELDRS
100 Krad
DESCRIPTION
This RHA level NPN switching transistor, MSR2N2222AUA device in a UA package, is ideal to
drive many high-reliability applications. This device is constructed and screened to a JANSR
performance level with radiation test method 1019 wafer lot acceptance conducted on all die
lots. Fully compliant to GSFC EEE-INST-002 reliability, screening and radiation hardness
assurance requirements for space flight projects.
Important: For the latest information, visit our website http://www.microsemi.com.
FEATURES
JEDEC registered 2N2222
TID level screened per MIL-PRF-19500
Also available with ELDRS testing to 0.01 Rad(s)/ sec
MKCR/MHCR chip die available
RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec dose rate
APPLICATIONS / BENEFITS
Rad-Hard power supplies
Rad-Hard motor controls
General purpose switching
Instrumentation Amps
EPS Satellite switching power applications
MAXIMUM RATINGS
MSC – Lawrence
6 Lake Street,
Lawrence, MA 01841
Tel: 1-800-446-1158 or
(978) 620-2600
Fax: (978) 689-0803
MSC – Ireland
Gort Road Business Park,
Ennis, Co. Clare, Ireland
Tel: +353 (0) 65 6840044
Fax: +353 (0) 65 6822298
Website:
www.microsemi.com
Parameters/Test Conditions Symbol Value Unit
Junction and Storage Temperature T
J
and T
STG
-65 to +200 ºC
Thermal Resistance Junction-to-Solder Pad (Ambient)
(see Figure 4)
R
ӨJSP(AM)
40 ºC/W
Thermal Resistance Junction-to-Solder Pad (Infinite Sink)
(
see Figure 3)
R
ӨJSP(IS)
110 ºC/W
Thermal Resistance Junction-to-Ambient (see Figure 3)
(1)
R
ӨJA
325 ºC/W
Total Power Dissipation:
(see Figures 1 and 2)
@ T
A
= +25 ºC
@ T
SP(IS)
= +25 ºC
@ T
SP(AM)
= +25 ºC
P
T
0.5
1.0
1.5
W
Collector-Base Voltage, Emitter Open V
CBO
75 V
Emitter-Base Voltage, Collector Open V
EBO
6 V
Collector-Emitter Voltage, Base Open V
CEO
50 V
Collector Current, dc I
C
800 mA
Solder Temperature @ 10 s T
SP
260
o
C
Notes: 1. For non-thermal conductive PCB or unknown PCB surface mount conditions in free air, substitute MIL-
PRF-19500/255 figures 8 and 13 and use R
θJA
.
T4-LDS-0337-1, Rev. 1 (04/15/14) ©2014 Microsemi Corporation Page 2 of 8
MSR2N2222AUA
MECHANICAL and PACKAGING
CASE: Hermetically sealed ceramic package
TERMINALS: Gold plate over nickel
MARKING: Manufacturer's ID, date code, part number
POLARITY: NPN (see package outline)
TAPE & REEL option: Per EIA-481 (consult factory for quantities)
WEIGHT: Approximately 0.12 grams
See Package Dimensions on last page.
PART NOMENCLATU RE
MSR 2N2222A UA
Reliability Level
MSR* – 100K Rads (Si)
Surface Mount package
JEDEC type number
*The MSR designator is our internal part nomenclature assigned to this family of parts, in lieu of pending JANSR
submissions through DLA (Defense Logistic Agency).
SYMBOLS & DEFINITIONS
Symbol Definition
I
B
Base current: The value of the dc current into the base terminal.
I
C
Collector current: The value of the dc current into the collector terminal.
I
E
Emitter current: The value of the dc current into the emitter terminal.
R
G
Gate drive impedance or Gate resistance
V
CB
Collector-base voltage: The dc voltage between the collector and the base.
V
CBO
Collector-base voltage, base open: The voltage between the collector and base terminals when the emitter terminal is
open-circuited.
V
CE
Collector-emitter voltage: The dc voltage between the collector and the emitter.
V
CEO
Collector-emitter voltage, base open: The voltage between the collector and the emitter terminals when the base
terminal is open-circuited.
V
EB
Emitter-base voltage: The dc voltage between the emitter and the base
V
EBO
Emitter-base voltage, collector open: The voltage between the emitter and base terminals with the collector terminal
open-circuited.