@ UN Semiconductor Co., Ltd. 2019
Specifications are subject to change without notice.
Please refer to www.unsemi.com.tw for current information.
I
hold
= Hold current: maximum current device will pass without tripping in 25°C still air.
I
trip
= Trip current: minimum current at which the device will trip in 25°C still air.
V
max
= Maximum voltage device can withstand without damage at rated current (I
max
)
I
max
= Maximum fault current device can withstand without damage at rated voltage (V
max
)
P
dtyp.
= Power dissipated from device when in the tripped state at 25°C still air.
R
min
= Minimum resistance of device in initial (un-soldered) state.
R
max
= Maximum resistance of device in initial (un-soldered) state.
R
1max
= Maximum resistance of device at 25°C measured one hour after tripping.
Caution: Operation beyond the specified rating may result in damage and possible arcing and flame.