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Introduction
The Keysight Technologies, Inc. B1505A Power Device Analyzer/Curve Tracer is a single-box
solution with next-generation curve tracer functionality that can accurately evaluate and
characterize power devices at up to 10 kV and 1500 A. The B1505A is capable of handling all
types of power device evaluation, with features that include a wide voltage and current range,
fast pulsing capability (10 µs), µΩ level on-resistance measurement resolution and sub-pA level
current measurement capability. In addition, an oscilloscope view permits visual verification of
both current and voltage pulsed waveforms.
Two independent analog-to-digital (A/D) converters on each channel support a 2 µs sampling
rate for accurate monitoring of the critical timings that can affect device behavior.
It can also perform fully automated capacitance measurements (such as Ciss, Coss and
Crss) at high voltage biases (up to 3 kV). Moreover, it can evaluate gate charge (which is an
important parameter for high frequency switching converter efficiency) at up to 3 kV as well.
The B1505A with EasyEXPERT group+ software includes a curve tracer mode that combines
familiar curve tracer functionality with the convenience of a PC-based instrument; this makes
it easy for traditional curve-tracer users to become productive quickly. Module selector,
device capacitance selector and Quick Test feature enable fully automated measurement on
multiple parameters without the need to recable. Keysight EasyEXPERT group+ GUI based
characterization software is available either on the B1505A’s embedded Windows 10 platform
with 15-inch touch screen or on your PC to accelerate the characterization tasks. It supports
efficient and repeatable device characterization in the entire characterization process from
measurement setup and execution to analysis and data management either interactive manual
operation or automation across a wafer in conjunction with a semiautomatic wafer prober.
EasyEXPERT group+ makes it easy to perform complex device characterization immediately
with hundreds of ready-to-use measurements (application tests) furnished, and allows you the
option of storing test condition and measurement data automatically after each measurement
in a unique built-in database (workspace), ensuring that valuable information is not lost and that
measurements can be repeated at a later date. The net result is improved ease of use, better
data analysis and simplified data management for the measurement of power devices and
power circuitry.