CHINA ELECTRONICS TECHNOLOGY INSTRUMENTS CO., LTD
1 www.ceyear.com
In recent years, the use of semiconductor material devices (such as
GaN) is becoming increasingly more common in the development of a
wide range of RF applications, where required device dimensions keep
decreasing, also electric field strength and current density increases
relatively. With the expanding devices application range and the
complicated goal-oriented scenarios, it becomes more and more
difficult to design, optimize and manufacture integrated circuits.
Therefore, accurate device testing is not only important for the
modeling analysis process, but also an essential part of device process
optimization and follow-up circuit design.
Ceyear’s on-wafer design & test solution of microwave power
semiconductor chip is based on the 3672 series high -performance
multi-function vector network analyzer platform. It provides industry -
leading performance on key parameters of interest such as gain, gain
compression and active intermodulation. We support active harmonic
pull function compatible with mainstream load pull equipment in the
market. We support customization for both probe station and probe
compatible with mainstream probe stations. We provide dual-frequency
nonlinear W parameter model analysis function compatible with
semiconductor design and development process using PHD harmonic
model. Moreover, we provide design simulation tools and solutions for
device testing, data analysis, and model extraction compatible with
mainstream design simulation software.
Highlights
Gain and Conventional
S- Parameter Measurement
Two-Dimension Fast Gain
Compression Measurement
Active Intermodulation Test
Pulse S-Parameter Test
Eight-Channel Fast Spectrum
Analysis Function
Active/Passive Load Pull Test
Constant Noise Circle Test
Function Based on Cold
Source Method
Thermal Parameter Test
Amplifier Gain Efficiency Test