EMC TEST REPORT
Report Number :
EMC20152755CRP Date of
Issue:
10 Oct 2015
Model / Serial No.
:
SDS 1202X-S,SDS 1202X, SDS 1102X-S, SDS
1102X, SDS 1072X-S, SDS 1072X, SDS 1052X,
SDS 1052X-S, MSO 1202X-S, MSO 1202X, MSO
1102X-S, MSO 1102X, MSO 1072X-S, MSO 1072X,
MSO 1052X, MSO 1052X-S
Product Type
: Digital Storage Oscilloscope
Applicant
:
Siglent Technologies Co.,LTD
Address
:
3/F, Building 4, Antongda Industrial Zone, Liuxian 3
Road, BaoAn District, Shenzhen, P.R.CHINA
Manufacturer
:
Siglent Technologies Co.,LTD
Address
:
3/F, Building 4, Antongda Industrial Zone, Liuxian 3
Road, BaoAn District, Shenzhen, P.R.CHINA
Test Result
:
Positive Negative
Total pages including
Appendices
:
36
This report is the confidential property of the client. As a mutual protection to our clients, the public and ourselves,
extracts from the test report shall not be reproduced except in full without our written approval.
, 2540C, 2540C-MSO,
2542C, 2542C-MSO, 2544C, 2544C-MSO, SDS
1202X+, SDS 1102X+, SDS 1072X+, SDS 1052X+
Page 1 of 35 Report No.:EMC20152755CRP
Compliance Test Department of Shenzhen ZTE Technology Service Co., Ltd
V3.4
Table of Content
1 General Information ................................................................................................................... 2
1.1 Notes.......................................................................................................................................... 2
1.2 Testing Laboratory ..................................................................................................................... 3
1.3 Details of Manufacture ............................................................................................................... 3
1.4 Application Details ..................................................................................................................... 3
1.5 Test Item .................................................................................................................................... 3
1.6 Applied Standard ....................................................................................................................... 3
2 Summary of Results .................................................................................................................. 4
3 Equipment Specification ............................................................................................................ 5
3.1 General Description ................................................................................................................... 5
3.2 Technical Specifications ............................................................................................................ 5
4 General configuration description and monitoring methods ..................................................... 7
5 Immunity Performance Criteria .................................................................................................. 8
5.1 Performance Criterion A (Continuous Phenomena) ................................................................. 8
5.2 Performance Criterion B (Transient Phenomena) ..................................................................... 8
5.3 Performance Criterion for Voltage dips and interruptions ......................................................... 8
6 Electromagnetic Susceptibility ................................................................................................... 9
6.1 Electrostatic Discharge Immunity test ....................................................................................... 9
6.2 Radiated Electric Fields Immunity test .................................................................................... 11
6.3 Electrical Fast Transient Bursts Immunity test ........................................................................ 13
6.4 Surges Immunity test ............................................................................................................... 14
6.5 Continuous Conducted Interference Immunity test ................................................................. 16
6.6 Voltage Dips and Short Interruption and Voltage Variation Immunity test.............................. 17
7 Electromagnetic Interference .................................................................................................. 18
7.1 Conducted Emissions .............................................................................................................. 18
7.2 Radiated Emissions ................................................................................................................. 20
7.3 Harmonics and Flicker Emission ............................................................................................. 22
8 Main Test Instruments ............................................................................................................. 24
9 System Measurement Uncertainty .......................................................................................... 25
10 Test record ............................................................................................................................... 26
10.1 Conducted Emission ................................................................................................................ 26
10.2 Radiated Emission ................................................................................................................... 28
10.3 Harmonics and Flicker Emission ............................................................................................. 32