Revision 1.1 (Jan. 2014) 1
GeneSiC Semiconductor Reliability Report on
1200 V SiC Junction
Transistor (SJT) Devices
Revision 1.1 (Jan. 2014) 2
Table of Contents
1.Report Summary ............................................................................ 3
2.Reliability Test Plan ....................................................................... 3
3.Reliability Test Descriptions ......................................................... 4
4.Device Failure Criteria .................................................................. 4
5.Parameter Verification Data ......................................................... 5
6.Reliability Testing Data ................................................................. 6
7.Conclusion ...................................................................................... 8