EX Certification & Qualification Plans
EX Certification
Certification
100% Testing
MIL-PRF-19500P Appendix E
Table E-IV - Screening Requirements
Test
Sample
Size
MIL-STD-750
Method
1a) Die visual For Glass Diodes
1b) Internal visual
2) High Temperature Life Optional 1032
Nonoperating Life
3a) Temperature Cycling 100% 1051
3b) Surge (as specified)
3c) Thermal Impedance (as specified) 100%
4) Constant Acceleration
5) PIND
6) Instability Shock Test
7) Hermetic Seal F&G
8) Serialization 100%
9) Interim Electrical Parameters 100%
10) HTRB 24 Hours 100% 1039 Condition A
11) Interim Electrical Parameters 100%
As Specified For Device Type
12) Burn-in 160 Hours 100% 1039 Condition B
13) Final Electrical Parameters 100%
As Specified For Device Type
14) Hermetic Seal F&G 100% 1071
15) Radiography
16) External Visual Examination
17) Case Isolation
EX Qualification
Qualification SubGroups A, B, C, E
Group A Group B
Subgroup 1 Subgroup 1
Visual & Inspection MIL-STD-750 Method 2071 Solderability
Resistance To Solvents
Subgroup 2
Salt Atmosphere
DC (Static) test @ +25C Subgroup 2
Thermal Shock Glass Diodes Only
Subgroup 3 Temperature Cycling 25 Cyc (20 @ Screening, totaling 45)
DC (Static) test @ -65C and +150C Surge Current
Hermetic Seal
Electrical Measurements Per Group A SubG 2
Subgroup 4
Dynamic test @ +25C
Subgroup 3
Steady State Operation Life Biased, 340 Hours
Electrical Measurements Per Group A SubG 2
Subgroup 5
Hermetic Seal Method 1071
Safe Operating Area Test Bond Strength Condition D 11 Wires
Subgroup 6
Surge Current
Subgroup 4
Decap - Internal Visual; Examination
Subgroup 5
Subgroup 7 Thermal Resistance Not Applicable - Case Mount Device
Select Static & Dynamic Tests
Subgroup 6
High Temperatrue Life, Non-Operating 340 Hours
Electrical Measurements Per Group A SubG 2
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