1
C0G (NP0) Dielectric, KGM Series
TDS-SMDMLCC-0036 | Rev 1
General Specications
C0G (NP0) is the most popular formulation of the “temperature-compensating,” EIA Class I ceramic materials.
Modern C0G (NP0) formulations contain neodymium, samarium and other rare earth oxides.
C0G (NP0) ceramics offer one of the most stable capacitor dielectrics available. Capacitance change with
temperature is 0 ±30ppm/°C which is less than ±0.3% C from -55°C to +125°C. Capacitance drift or hysteresis
for C0G (NP0) ceramics is negligible at less than ±0.05% versus up to ±2% for lms. Typical capacitance
change with life is less than ±0.1% for C0G (NP0), one-fth that shown by most other dielectrics. C0G (NP0)
formulations show no aging characteristics.
HOW TO ORDER
A
Thickness
See Cap Chart
CG
Dielectric
CG = C0G
102
Capacitance
Code Code (in pF)
2 Signicant Digits
+Number of zeros
eg. 10µF = 106
10nF = 103
47pF = 470
L
Packaging
See Table Below
KGM
Series
General Purpose
Tin/Nickel Finish
F
Capacitance
Tolerance
B = ±.10pF (<10pF)*
C = ±.25pF (<10pF)*
D = ±.50pF (<10pF)*
F = ±1% (��10pF)*
G = ±2% (≥10pF)*
J = ±5% (≥10pF)
K = ±10% (≥10pF)
M = ±20%
*COG only
PACKAGING CODES
Code EIA (inch) IEC(mm) 7" Paper 7" Embossed 13" Paper 13"Embossed
02 0101 0402 H n/a
03 0201 0603 H N
05 0402 1005 H N
15 0603 1608 T M
21 0805 2012 T U M L
31 1206 3216 T U M L
32 1210 3225 U L
43 1812 4532 V S
44 1825 4564 V S
55 2220 5750 V S
56 2225 5763 V S
21
02 = 0101
03 = 0201
05 = 0402
15 = 0603
21 = 0805
31 = 1206
32 = 1210
43 = 1812
44 = 1825
55 = 2220
56 = 2225
Size
2J
Voltage
0G = 4.0V
0J = 6.3V
1A = 10V
1C = 16V
1E = 25V
1H = 50V
2A = 100V
2D = 200V
2E = 250V
2H = 500V
–
surface mount ceramic capacitor products
–
The Important Information/Disclaimer is incorporated in the catalog where these specications came from or available
online at www.kyocera-avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
2
C0G (NP0) Dielectric, KGM Series
Specications and Test Methods
Parameter/Test NP0 Specication Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specied tolerance
<30 pF: Q≥ 400+20 x Cap Value
≥30 pF: Q≥ 1000
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
1.0 kHz ± 10% for cap > 1000 pF
Voltage: 1.0Vrms ± .2V
Q
Insulation Resistance
10,000MΩ or 500MΩ - µF,
whichever is less
Charge device with rated voltage for 60 ± 5 secs
@ room temp/humidity
Dielectric Strength No breakdown or visual defects
Charge device with 250% of rated voltage for 1-5
seconds, w/charge and discharge current limited
to 50 mA (max)
Note: Charge device with 150% of rated voltage
for 500V devices.
Resistance to
Flexure
Stresses
Appearance No defects
Deection: 2mm
Test Time: 30 seconds
Capacitance
Variation
±5% or ±.5 pF, whichever is greater
Q Meets Initial Values (As Above)
Insulation
Resistance
≥ Initial Value x 0.3
Solderability
≥ 95% of each terminal should be covered
with fresh solder
Dip device in eutectic solder at 230 ± 5ºC for 5.0 ±
0.5 seconds
Resistance to
Solder Heat
Appearance No defects, <25% leaching of either end terminal
Dip device in eutectic solder at 260ºC for
60sec- onds. Store at room temperature
for 24 ± 2hours before measuring electrical
properties.
Capacitance
Variation
≤ ±2.5% or ±.25 pF, whichever is greater
Q Meets Initial Values (As Above)
Insulation
Resistance
Meets Initial Values (As Above)
Dielectric
Strength
Meets Initial Values (As Above)
Thermal Shock
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation
≤ ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes
Q Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Insulation
Resistance
Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Dielectric
Strength
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after
24 hours at room temperature
Load Life
Appearance No visual defects
Charge device with twice rated voltage in test
chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0).
Remove from test chamber and stabilize at
room temperature for 24 hours
before measuring.
Capacitance
Variation
≤ ±3.0% or ± .3 pF, whichever is greater
Q
(C=Nominal Cap)
≥ 30 pF: Q≥ 350
≥10 pF, <30 pF: Q≥ 275 +5C/2
<10 pF: Q≥ 200 +10C
Insulation
Resistance
≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
Load
Humidity
Appearance No visual defects
Store in a test chamber set at 85ºC ± 2ºC/ 85% ±
5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at room
temperature for 24 ± 2 hours before measuring.
Capacitance
Variation
≤ ±5.0% or ± .5 pF, whichever is greater
Q
≥ 30 pF: Q≥ 350
≥10 pF, <30 pF: Q≥ 275 +5C/2
<10 pF: Q≥ 200 +10C
Insulation
Resistance ≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
TDS-SMDMLCC-0036 | Rev 1
–
surface mount ceramic capacitor products
–
The Important Information/Disclaimer is incorporated in the catalog where these specications came from or available
online at www.kyocera-avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.