1
General Specications
The X7R dielectric is the most popular of the intermediate EIA class II materials due to its relative temperature stability.
While the capacitance change is non-linear, temperature variation is within ±15% from - 55°C to + 125°C.
Capacitance for X7R varies under the inuence of electrical operating conditions such as voltage and frequency. X7R
dielectric chip usage covers a broad spectrum of industrial applications where known changes in capacitance due to
applied voltages are acceptable.
SpiCAT is an additional online resource that KAVX offers to help create engineering simulations. Please visit spicat.
kyocera-avx.com for more information.
TDS-SMDMLCC-0038 | Rev 2
X7R Dielectric, KGM Series
HOW TO ORDER
A
Thickness
See Cap Chart
R7
Dielectric
X7R = R7
101
Capacitance
Code Code (in pF)
2 Signicant Digits
+Number of zeros
eg. 10µF = 106
10nF = 103
47pF = 470
N
Packaging
See Table Below
M
Capacitance
Tolerance
J* = +/- 5%
K = +/- 10%
M = +/- 20%
03
02= 0101
03= 0201
05= 0402
15=0603
21=0805
31=1206
32=1210
43=1812
44=1825
55=2220
56=2225
Size
1E
Voltage
0G= 4.0V
0J= 6.3V
1A=10V
1C=16V
1E= 25V
1H=50V
2A= 100V
2D= 200V
2E=250V
2H=500V
PACKAGING CODES
Code EIA (inch) IEC(mm) 7" Paper 7" Embossed 13" Paper 13"Embossed
02 0101 0402
03 0201 0603 H N
05 0402 1005 H N
15 0603 1608 T U M L
21 0805 2012 T U M L
31 1206 3216 T U M L
32 1210 3225 U L
43 1812 4532 V S
44 1825 4564 V S
55 2220 5750 V S
56 2225 5763 V S
KGM
Series
General Purpose
Tin/Nickel Finish
–
surface mount ceramic capacitor products
–
The Important Information/Disclaimer is incorporated in the catalog where these specications came from or available
online at www.kyocera-avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
2
X7R Dielectric, KGM Series
Specications and Test Methods
Parameter/Test X7R Specication Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specied tolerance
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10µF, 0.5Vrm @ 120Hz
Dissipation Factor
≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
Contact Factory for DF by PN
Insulation Resistance
10,000MΩ or 500MΩ - µF,
whichever is less
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Dielectric Strength No breakdown or visual defects
Charge device with 250% of rated voltage for 1-5 seconds, w/
charge and discharge current limited to 50 mA (max)
Note: Charge device with 150% of rated voltage for 500V devices.
Resistance to
Flexure
Stresses
Appearance No defects
Deection: 2mm
Test Time: 30 seconds
Capacitance
Variation
≤ ±12%
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
≥ Initial Value x 0.3
Solderability
≥ 95% of each terminal should be covered with
fresh solder
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Resistance to
Solder Heat
Appearance No defects, <25% leaching of either end terminal
Dip device in eutectic solder at 260ºC for 60 seconds. Store at
room temperature for 24 ± 2hours before measuring electrical
properties.
Capacitance
Variation
≤ ±7.5%
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
Meets Initial Values (As Above)
Dielectric
Strength
Meets Initial Values (As Above)
Thermal Shock
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation
≤ ±7.5% Step 2: Room Temp ≤ 3 minutes
Dissipation
Factor
Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Insulation
Resistance
Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Dielectric
Strength
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after 24 ± 2 hours at room
temperature
Load Life
Appearance No visual defects Pre-treatment: After mounting, perform heat treatment 150+0/-
10C for 2 hour, then stabilise for 24+/-2 hour at room temp,
then measure.
Charge device with ≥ rated voltage in test chamber set at
125ºC ± 2ºC for 1000 hours (+48, -0).
Pre-treatment: After remove from test chamber, perform heat
treatment 150+0/-10C for 2 hour, then stabilise for 24+/-2 hour
at room temp, then measure.
Contact KYOCERA AVX for datasheet of specic parts.
Capacitance
Variation
≤ ±12.5%
Dissipation
Factor
≤ Initial Value x 2.0 (See Above)
Insulation
Resistance
≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
Load
Humidity
Appearance No visual defects
Pre-treatment: After mounting, perform heat treatment 150+0/-
10C for 2 hour, then stabilise for 24+/-2 hour at room temp,
then measure.
Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5% relative
humidity for 1000 hours (+48, -0) with rated voltage applied.
Pre-treatment: After remove from test chamber, perform heat
treatment 150+0/-10C for 2 hour, then stabilise for 24+/-2 hour
at room temp, then measure.
Capacitance
Variation
≤ ±12.5%
Dissipation
Factor
≤ Initial Value x 2.0 (See Above)
Insulation
Resistance
≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
TDS-SMDMLCC-0038 | Rev 2
–
surface mount ceramic capacitor products
–
The Important Information/Disclaimer is incorporated in the catalog where these specications came from or available
online at www.kyocera-avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.