SENSITRON _
SEMICONDUCTOR
DATASHEET 323, REV J
© 2021 Sensitron Semiconductor Ph (631) 586 7600 Fx (631) 242 9798 www.sensitron.com sales@sensitron.com
SS-100 SCREENING FLOW
SS-100 SCREENING FLOW
DISCRETE SEMICONDUCTORS
(Not applicable for Axial & MELF Diodes)
All parts procured with JAN-S Screening shall be 100% screened in accordance with the following procedure.
TEST / PROCESS
MIL-STD-750 TEST METHOD
TEST CONDITIONS
1a
Die Visual
2073
Condition B, die form prior to assembly
1b
Internal Visual
2074 Diodes (Glass)
2069 Power FETs
2072 Transistors, non-glass Diodes
As specified
3a
Temperature Cycling
1051
Test condition C or maximum storage
temperature, whichever is less.
20 cycles, t (extremes) 10 minutes.
No dwell time required at 25
0
C.
3b
Surge Current
4066
Condition A or B, as specified. Only
applicable if specified.
3c
Thermal Impedance
3161 Power FETs
3103 IGBT
3131 Bipolar
3101 Diodes
Only applicable if specified.
4
Constant Acceleration Not
required for stud devices and
metallurgically bonded diodes
2006
Y1 direction @ 20,000G, except at 10,000G
for power rating > 10W at Tc = 25C - 1-
minute hold time does not apply
5
PIND
2052
Test Condition A
8
Serialization
-
-
9
Interim Electrical Parameters
-
Per device detail specification. 100% Read
and Record.
10
High Temperature Reverse
Bias - HTRB
1039 Transistors
1042 Power FETs
1038 Diodes and Rectifiers
Condition A 80% (minimum of rated VCB
(bipolar), VGS (FET) or VDS (FET).
Condition B 80% (minimum) of rated VGS.
Condition A 80% (minimum) of rated VR or
VRWM; 100% of VRWM if half sine
condition is specified.
80%~85% of nominal Vz for Zeners with Vz
˃ 10V; omit for zeners with Vz 10V
11
Interim Electrical Parameters
-
As specified, but including all delta
parameters, as a minimum. Leakage current
shall be measured prior to any other
parameter, within 16 hours after removal of
applied voltage in HTRB.
12
Burn-In
1039 Bipolar Transistors
1042 Power FETs
1038 Diodes, Rectifiers and Zeners
1038 Case mount Rectifiers
1040 Thyristors
Condition B 240 hours minimum.
Condition A 240 hours minimum.
Condition B 240 hours minimum.
Condition B 240 hours minimum
240 hours minimum (full wave blocking test).
13
Final Electrical
-
Group A, Subgroup 2, and delta parameters.
Glass Rectifiers and Switching Diodes need
Scope Display
13a
PDA
5% Max
SENSITRON _
SEMICONDUCTOR
DATASHEET 323, REV J
© 2021 Sensitron Semiconductor Ph (631) 586 7600 Fx (631) 242 9798 www.sensitron.com sales@sensitron.com
SS-100 SCREENING FLOW
Other Electrical
-
As specified; Group A, subgroup 3
14
Hermetic Seal
a. Fine
b. Gross
1071
Fine leak not required for Double Plug
Diodes
15
Radiography
2076
-
16
External Visual
2071
After complete marking, prior to lot
acceptance.
17
Case Isolation
To be performed on case isolated
packages.
As specified.
Notes: 1) Sequence and testing varies per device.
2) For diode bridges pre-cap visual is performed at the bridge assembly level prior to potting.
3) Flow in accordance with slash sheet may be used if applicable.
SS-100 SCREENING FLOW
AXIAL AND MELF ZENER DIODES
All parts procured with JAN-S Screening shall be 100% screened in accordance with the following procedure.
SCREEN
NUMBER
TEST/PROCESS
MIL-STD-750
TEST METHOD
TEST CONDITION
1a
Die Visual
2073
-
1b
Internal Visual
2074
-
3a
Temperature Cycling
(Thermal Shock)
1051
No dwell time is required at +25
o
C. Test condition C, or
maximum storage temperature, whichever is less, 20
cycles.
3b
Surge Current
If specified on Slash Sheet
4066
Condition B as specified
3c
Thermal Impedance
3101
As specified on Slash Sheet
7
Hermetic Seal
1071
-
8
Serialization
-
-
9
Electrical Tests
-
As specified; Read and Record.
10
High Temperature Reverse
Bias (HTRB)
1038A
Test Condition A
T
A
= 150
o
C ; t = 48 hrs; V = 80% of V
Z NOM
11
Electrical Tests and delta
parameters for PDA
-
As specified; Read and Record.
12
Burn-In
1038B
Test Condition B
T
A
= +75
o
C
MAX
. ; t = 240 hrs. ; I
Z (MIN)
as specified ;
T
J
MIN
= as specified; adjust I
Z
and/or T
A
to achieve the
required T
J MIN
13a
Electrical Tests and delta
parameters for PDA
-
As specified; Read and Record ; Group A, subgroup 2
13b
Other Electrical
-
As specified; Group A, subgroup 3
15
Radiography
2076
-
16
External Visual
2071
After complete marking, prior to lot acceptance.