OBR 4600

Optical Backscatter Reflectometer

The Luna OBR 4600 is part of Luna’s award winning Optical

Backscatter Reectometer

product line.

Designed for component and shortrun network testing and

troubleshooting, the OBR 4600 enables ultra-high resolution

reectometry with backscatter-level sensitivity. With sampling

resolution as low as 10 microns, zero dead zone, an extremely

low noise oor, and options for extended range and distributed

temperature and strain sensing, the OBR 4600 offers industry

leading reectometry technology that allows you to “see inside”

your components and systems like never before.

KEY FEATURES

APPLICATIONS

Use convenient cursor tools to measure and examine scatter level and reflection

events to measure RL and IL for closely spaced events.

• “Zero Dead Zone” reectometer

• Measure 30 m with 10 μm

sampling resolution

• 80 dB dynamic range

• Backscatter-level sensitivity (-130 dB)

• High-speed scanning (1 m

segments at up to 3 Hz)

• Extended range provides 2 km

range with no dead zone

• Measure IL, RL, distributed loss,

distance, polarization states,

phase derivative and group delay

• High resolution C and L band

(OBR 4600) or O band (OBR 4613)

capability

• Easily locate, identify and

troubleshoot macro-bends,

splices, connectors and breaks

• Locate IL points at every point

in the network or assembly –

eliminate cutbacks

• Test and troubleshoot short-run

networks (up to 2 km)

• Unprecedented visibility into

miniaturized components

“Zero Dead Zone” reectometer designed

to “see inside” components and systems

OBR 4600 Optical Backscatter Reflectometer

The 1 meter spiral waveguide is shown in the scan waveguide

crossing the rings of spiral below. The graph clearly shows the

distributed loss across the one meter spiral, including scattering

at the crossing of the horizontal waveguide.

SPOT SCAN MODE

EXAMPLE APPLICATION – SILICON PHOTONICS

The Spot Scan mode allows scanning of any 1 or 2 meter region of the device being tested, resulting in shorter

measurement times and smaller data les. Rates in the following table are for measurements made with a laser

tuning speed of 100 nm/s.

Devices built on a silicon photonic platform represent a high level of functionality miniaturized into an extremely high

packaging density. The high spatial resolution and high sensitivity of the OBR 4600 offer the capability to see inside

the device with a very high level of detail.

For example, the Optoelectronics Research Group at UCSB fabricated

a one meter spiral delay line on a silicon platform. The OBR 4600 was

used to measure the distributed loss inside the photonic integrated

circuit (PIC), which measured only 1 cm

in size.

A scan of the horizontal portion of the waveguide that crosses over

the spiral is shown in the graph below. The waveguide crossings,

spaced at just 50 microns, are clearly visible.

Spot Scan Measurement Rates

Mode 30 m mode 70 m mode

Extended Range

(2000 m)

Subregion scanned 1 or 2 m 1 or 2 m 80 m

Wavelength

Range

3.2 nm - - 0.15 Hz

5 nm 3.7 Hz 2.9 Hz -

20 nm 1.8 Hz 1.2 Hz -

80 nm 0.5 Hz - -

Best Sampling Resolution 10 μm 20 μm 0.25 mm

50 individual reections from horizontal

waveguide crossing the rings of spiral

2.6 mm

Scattering from horizontal portion

crossing the rings of spiral

Scattering from rings crossing

horizontal portion of waveguide

End facet

Distributed loss across

1m spiral delay line