OBR 4610
Optical Backscatter Reflectometer
TM
The Luna OBR 4610 extends Luna’s award winning Optical
Backscatter Reectometer
TM
technology to 1060 nm applications.
Designed for component and short optical network testing and
troubleshooting, the OBR 4610 delivers ultra-high resolution
reectometry with backscatter-level sensitivity. With sampling
resolution as low as 10 microns, zero dead zone, an extremely
low noise oor, the OBR 4610 allows you to “see inside” your
components and systems and map reection loss along the entire
length of the optical path. Backscatter-level sensitivity allows
distributed IL measurements as well. The OBR 4610 provides
spectral analysis of the optical path and phase measurements.
KEY FEATURES
APPLICATIONS
Use convenient cursor tools to measure and examine scatter level and reflection
events to measure RL and IL for closely spaced events.
• “Zero Dead Zone” reectometer
for optical components and
systems
• Operates at 1040 - 1080 nm
• Sampling resolution of 10 μm
at 30 m length
• 80 dB dynamic range
• Backscatter-level sensitivity (-130 dB)
• High-speed scanning
• Measure IL, RL, distributed loss,
distance, polarization states,
phase derivative and group delay
• Analyze distributed loss in
components and short optical
networks
• Easily locate, identify and
troubleshoot macro-bends,
splices, connectors and breaks
• Test and troubleshoot short-run
networks and systems
• Unprecedented visibility into
miniaturized components
“Zero Dead Zone” reectometer designed
to “see inside” components and systems
Preliminary Data Sheet