DATA SHEET
www.onsemi.com
© Semiconductor Components Industries, LLC, 1998
January, 2022 Rev. 6
1 Publication Order Number:
NDS7002A/D
N-Channel Enhancement
Mode Field Effect
Transistor
2N7000, 2N7002,
NDS7002A
Description
These Nchannel enhancement mode field effect transistors are
produced using onsemis proprietary, high cell density, DMOS
technology. These products have been designed to minimize onstate
resistance while providing rugged, reliable, and fast switching
performance. They can be used in most applications requiring up to
400 mAdc and can deliver pulsed currents up to 2 A. These products
are particularly suited for lowvoltage, lowcurrent applications, such
as small servo motor control, power MOSFET gate drivers, and other
switching applications.
Features
High Density Cell Design for Low R
DS(on)
Voltage Controlled Small Signal Switch
Rugged and Reliable
High Saturation Current Capability
This Device is PbFree and Halogen Free
See detailed ordering and shipping information on page 7 of
this data sheet.
ORDERING INFORMATION
MARKING DIAGRAM
TO92
CASE 135AN
&E = Designates Space
&Y = Binary Calendar Year Coding Scheme
7x2 = Specific Device Code
x= 0, 1
&G = Date Code
S
D
G
&E&Y
7x2&E&G
SOT23
CASE 31808
$Y = Logo
&Z = Assembly Plant Code
&3 = Date Code
2N7000 = Specific Device Code
$Y&Z&3
2N
7000
1
2
3
1
2
3
TO92
CASE 135AR
MARKING DIAGRAM
1 Drain
2 Gate
3 Source
1 Gate
2 Source
3 Drain
1
2
3
2N7000, 2N7002, NDS7002A
www.onsemi.com
2
ABSOLUTE MAXIMUM RATINGS Values are at T
C
= 25°C unless otherwise noted.
Symbol
Parameter
Value
Unit
2N7000 2N7002 NDS7002A
V
DSS
DraintoSource Voltage 60 V
V
DGR
DrainGate Voltage (R
GS
1 MW) 60 V
V
GSS
GateSource Voltage Continuous ±20
V
GateSource Voltage Non Repetitive (tp < 50 ms) ±40
I
D
Maximum Drain Current Continuous 200 115 280
mA
Maximum Drain Current Pulsed 500 800 1500
P
D
Maximum Power Dissipation Derated above 25°C
400 200 300 mW
3.2 1.6 2.4 mW/°C
T
J
, T
STG
Operating and Storage Temperature Range 55 to 150 65 to 150 °C
T
L
Maximum Lead Temperature for Soldering Purposes,
1/16inch from Case for 10 s
300 °C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
THERMAL CHARACTERISTICS Values are at T
C
= 25°C unless otherwise noted.
Symbol
Parameter
Value
Unit
2N7000 2N7002 NDS7002A
R
θ
JA
Thermal Resistance, Junction to Ambient 312.5 625 417 °C/W
ELECTRICAL CHARACTERISTICS
Values are at T
C
= 25°C unless otherwise noted.
Symbol
Parameter Conditions Type Min. Typ. Max. Unit
OFF CHARACTERISTICS
BV
DSS
DrainSource Breakdown
Voltage
V
GS
= 0 V, I
D
= 10 mA
All 60 V
I
DSS
Zero Gate Voltage Drain
Current
V
DS
= 48 V, V
GS
= 0 V
2N7000
1
mA
V
DS
= 48 V, V
GS
= 0 V,
T
C
= 125°C
1 mA
V
DS
= 60 V, V
GS
= 0 V
2N7002
NDS7002A
1
mA
V
DS
= 60 V, V
GS
= 0 V,
T
C
= 125°C
0.5 mA
I
GSSF
Gate Body Leakage,
Forward
V
GS
= 15 V, V
DS
= 0 V 2N7000 10
nA
V
GS
= 20 V, V
DS
= 0 V 2N7002
NDS7002A
100
I
GSSR
Gate Body Leakage,
Reverse
V
GS
= 15 V, V
DS
= 0 V 2N7000 10
nA
V
GS
= 20 V, V
DS
= 0 V 2N7002
NDS7002A
100
ON CHARACTERISTICS
V
GS(th)
Gate Threshold Voltage
V
DS
= V
GS
, I
D
= 1 mA 2N7000 0.8 2.1 3
V
V
DS
= V
GS
, I
D
= 250 mA
2N7002
NDS7002A
1 2.1 2.5