RU3070L
Min. Typ. Max.
BV
DSS
Drain-Source Breakdown Voltage 30 V
ec
r
ca
arac
er
s
cs (T
C
=25°C Unless Otherwise Noted)
Static Characteristics
Symbol Parameter Test Condition
RU3070L
Unit
V
GS
=0V, I
DS
=250µA
1
T
J
=125°C
30
V
GS(th)
Gate Threshold Voltage 1 3 V
I
GSS
Gate Leakage Current ±100 nA
3.3 4.3 mΩ
R
④
Drain-Source On-state Resistance
V
GS
=10V, I
DS
=70A
V
GS
=±20V, V
DS
=0V
V
DS
=V
GS
, I
DS
=250µA
I
DSS
Zero Gate Voltage Drain Current
V
DS
=30V, V
GS
=0V
µA
56mΩ
V
SD
④
Diode Forward Voltage 1.2 V
trr
Reverse Recovery Time 35 ns
Qrr
Reverse Recovery Charge 23 nC
I
SD
=70A, V
GS
=0V
I
SD=70A, dlSD/dt=100A/µs
V
GS
=4.5V, I
DS
=56A
Diode Characteristics
R
G
Gate Resistance 1.9 Ω
C
iss
Input Capacitance 2200
C
oss
Output Capacitance 370
C
rss
Reverse Transfer Capacitance 250
V
GS
=0V,V
DS
=0V,F=1MHz
V
GS
=0V,
V
DS
=15V,
Frequency=1.0MHz
pF
Dynamic Characteristics
⑤
t
d(ON)
Turn-on Delay Time 7
t
r
Turn-on Rise Time 12
t
d(OFF)
Turn-off Delay Time 28
t
f
Turn-off Fall Time 11
V
DD
=15V, I
DS
=70A,
V
GEN
=10V, R
G
=5Ω
Gate Char
e Characteristics
⑤
ns
Q
g
Total Gate Charge 32
Q
gs
Gate-Source Charge 5
Q
gd
Gate-Drain Charge 10
Notes:
V
DS
=24V, V
GS
=10V,
I
DS
=70A
①Pulse width limited by safe operating area.
nC
②Calculated continuous current based on maximum allowable junction temperature.
③Limited by T
Jmax
, I
AS
=28A, V
DD
= 24V, R
G
= 50Ω , Starting T
J
= 25°C.
④Pulse test;Pulse width≤300µs, duty cycle≤2%.
⑤Guaranteed by design, not subject to production testing.
Ruichips Semiconductor Co., Ltd
Rev. B– AUG., 2015
2 www.ruichips.com