Product Reliability
Reliability Results for Product Type 1N4745A
© 2017 Nexperia B.V.
All rights reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The
information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable
and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication
thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights.
nexperia.com
Time period: Q4/2015 to Q3/2016
Test Results
Test
Conditions
Duration
Quantity
Rejects
# 1
TEST
Pre- and Post-Stress
Electrical Test
T
amb
= 25 °C
N/A
all parts
see below
# 2
PC
Preconditioning
JESD22-A113
Bake T
amb
= 125 °C
Soak T
amb
= 85 °C, RH = 85%
Reflow soldering
24 hours
168 hours
3 cycles
7680
0
# 5
HTRB
High Temperature
Reverse Bias
MIL-STD-750-1
M1038 Method A
T
j
= T
jmax
, Vr = 100% of max.
datasheet reverse voltage
1000 hours
1280
0
# 7
TC
Temperature Cycling
JESD22-A104
-55 °C to T
jmax
, not to exceed 150°C
1000 cycles
2960
0
# 8
AC
Autoclave
JESD22-A102
T
amb
= 121 °C, RH = 100 %
Pressure = 205 kPa (29.7 psia)
96 hours
1360
0
# 9
H3TRB
High Humidity High
Temperature Reverse Bias
JESD22-A101
T
amb
= 85 °C, RH = 85%, V
R
> 80 % of
rated reverse voltage
1000 hours
n.a.
n.a.
# 10
IOL
Intermittent Operating
Life
MIL-STD-750 Method 1037
t
on
= t
off
, devices powered to insure
ΔT
j
= 125 °C for 7500 cycles or
ΔT
j
= 100 °C for 15000 cycles
1000 hours
3360
0
# 20
RSH
Resistance to Solder Heat
JESD22-A111
260 °C ± 5 °C
10 s
1510
0
# 21
SD
Solderability
J-STD-002
Test method B and D
1720
0
Calculation of FIT and MTBF
Test considered for FIT calculation: High Temperature Reverse Bias (HTRB, Test # 5)
Confidence level 60%, derated to 55 °C, activation energy 0.7 eV, test time 168 to 1000 hours
Wafer Fab
Technology
Quantity
Rejects
Failure Rate
MTBF
Phenitec
Zener / Protection
1280
0
3.32 FIT
34385 years