Product Quality Information
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Quality Information for Product Type 1N4728A
Quality and reliability data provided by Nexperia is intended to be a non-binding estimate of product
performance only. It does not imply that any performance levels reflected in such data can be met if the
product is operated outside the conditions expressly stated in the latest published data sheet for a device or
in your application.
Quick reference
Information
Content
Device Type
1N4728A
Ordering Information (12NCs)
9339 315 40113, 9339 315 40133
Qualification Grade
non automotive
Package
SOD66 (DO-41)
Waferfab
Wafer foundry PHENITEC
Assembly
Subcontractor Tak Cheong
ESD HBM
> 8000 V
ESD MM
> 400 V
Calculated Failure Rate
3.32 FIT
MTBF/MTTF
3.01E+08 hours
Explanation
Automotive qualified products are in accordance with the AEC-Q101.
Electrostatic Discharge (ESD) tests are performed as described in the AEC-Q101 with each 3 positive and 3
negative pulses for each stress voltage level.
Test considered for FIT calculation: High Temperature Reverse Bias (HTRB, AEC-Q101 Test # 5). The
parameters for calculation of FIT and MTBF/MTTF are as follows: Confidence level 60%, junction
temperature derated to 55 °C, activation energy 0.7 eV, test time 168 - 1000 hrs.
For discrete semiconductor devices the Mean Time Between Failure (MTBF) is replaced by the Mean Time To
Failure (MTTF) acronym. MTTF is calculated from the Intrinsic Failure Rate.