4LS – High-Speed Line Scan Image Sensors
High-Speed Line Scan
Image Sensors
ams.com/4LS
- High speed of up to 120 kLines/s x 4 Lines
- RGB + Clear (no filter) or 4:1 Time Delay and Integrate (TDI) operation
- 5.6 × 5.6 µm
2
pixel size
- Resolutions of 10k and 15k
ams.com
sensors@ams.com
© 12/2020 by ams
Subject to change without notice
Headquarters
ams AG
Tobelbader Strasse 30, 8141 Premstaetten, Austria
Phone +43 3136 500-0
Sales O ces Worldwide
sales-europe@ams.com
sales-asia@ams.com
sales-americas@ams.com
General Description
The 4LS series are the newest line scan image sensors from ams. As a family of high-
speed line-scan sensors featuring four lines of pixels, 4LS has both monochrome and
color versions. Designers can use 4:1 digital TDI (Time Delay and Integration) to get
high image quality under lower illuminated environments or perform high-speed
object inspection. 4LS also supports True Color applications with extended spectral
range. Each of the four lines of the 4LS sensor can be triggered for exposure and
reset independently and can have individual gain settings (CDS and digital gain).
Alternatively, all four lines can be read out simultaneously over bit serial LVDS output
taps. 4LS features a low noise pixel with true CDS (correlated double sampling) and
global shutter, allowing fully pipelined readout and integration.
Features Bene ts
Applications Block Diagram
- Up to four simultaneously and fully independently operated lines
- Con gurable output bandwidth
- Con gurable full well up to 40 ke-
- COB/Invar package
- 5.6 × 5.6 µm
2
pixel size
- 4:1 digital TDI in B&W
- Higher machine production speed
- Full RGB color acquisition
- Lower pin count integration for lower speed applications
- Only sensor on the market with 4 simultaneously and fully
independently operating lines
- Mechanically robust package providing high mechanical and
thermal stability and planarity of the die
- Document scanner
- Print inspection (i.e. glass, PCB, LCD)
- High end web inspection
- Food sorting / inspection
- Drug inspection
- High quality material inspection
- OCR (optical character recognition)
- Logistics
S &H
ADC
SRAM
CDS Stage
4 x Readout
4 x Serializer
S &H
ADC
SRAM
CDS Stage
4 x Readout
4 x Serializer
4 x LVDS Data Channels4 x LVDS Data Channels
Bias & Reference Generation
PLL
Serializer
Data Clock LVDS
SPI
Temperature
Sensor
RST_CDS_ L 1
SAMPLE_L1
EXT_SYNC EXT_SYNC
START _READOUT
SAMPLE _L2
RST_CDS_ L2
SCLK
N_ CS
MOSI
MISO
FORCE _UPDATE
1 2 ... 15 16 17 18 19 20 ... 2557 2558 2559 2560 2561 2562 ... 2575 2576
1 2 ... 15 16 17 18 19 20 ... 25 57 25 58 25 59 25 60 25 61 25 62 ... 25 75 25 76
N_ RST_SPI
N_ RST _PLL
RST_CVC _L2
RST_CVC _L1
MCLK
MCLK
TOP
5. 6 µm
5. 6 µm
5.6 µm
START_AD
N_ RST_LOGIC
START_AD
N_RST_LOGIC
START_READOUT
N_ RST_LOGIC
MCLK
LVAL
LVAL
N_RST_LOGIC
MCLK