Mar. 2, 2021 © 2021 Transphorm Inc. Subject to change without notice.
tp65h300g4lsg.2v1 1
TP65H300G4LSG
650V SuperGaN
®
FET in PQFN (source tab)
Key Specifications
V
DSS
(V) 650
V
DSS(TR)
(V) 800
R
DS(on)
(mΩ) max* 312
Q
RR
(nC) typ 23
Q
G
(nC) typ 9.6
* Dynamic R
DS(on)
; see Figures 18 and 19
Features
• JEDEC-qualified GaN technology
• Dynamic R
DS(on)
production tested
• Robust design, defined by
— Intrinsic lifetime tests
— Wide gate safety margin
— Transient over-voltage capability
• Enhanced inrush current capability
• Very low Q
RR
• Reduced crossover loss
Benefits
• Enables AC-DC bridgeless totem-pole PFC designs
— Increased power density
— Reduced system size and weight
— Overall lower system cost
• Achieves increased efficiency in both hard- and soft-
switched circuits
• Easy to drive with commonly-used gate drivers
• GSD pin layout improves high speed design
Applications
• Consumer
• Power adapters
• Low power SMPS
• Lighting
Description
The TP65H300G4LSG 650V, 240 mΩ gallium nitride (GaN)
FET is a normally-off device using Transphorm’s Gen IV
platform. It combines a state-of-the-art high voltage GaN
HEMT with a low voltage silicon MOSFET to offer superior
reliability and performance.
The Gen IV SuperGaN
®
platform uses advanced epi and
patented design technologies to simplify manufacturability
while improving efficiency over silicon via lower gate charge,
output capacitance, crossover loss, and reverse recovery
charge.
Related Literature
• AN0003: Printed Circuit Board Layout and Probing
• AN0007: Recommendations for Vapor Phase Reflow
• AN0009: Recommended External Circuitry for GaN FETs
• AN0012: PQFN Tape and Reel Information
Product Series and Ordering Information
Part Number Package
Package
Configuration
TP65H300G4LSG-TR* 8x8 PQFN Source
S
G
D
TP65H300G4LSG
PQFN
(top view)
Cascode Device Structure Cascode Schematic Symbol
* “-TR” suffix refers to tape and reel. Refer to AN0012 for details.