Applicability

This document applies to the part numbers of STM32WB55xx/STM32WB35Cx devices and the device variants as stated in this

page.

It gives a summary and a description of the device errata, with respect to the device datasheet and reference manual RM0434.

Deviation of the real device behavior from the intended device behavior is considered to be a device limitation. Deviation of the

description in the reference manual or the datasheet from the intended device behavior is considered to be a documentation

erratum. The term “errata” applies both to limitations and documentation errata.

Table 1. Device summary

Reference Part numbers

STM32WB55Cx STM32WB55CC, STM32WB55CE, STM32WB55CG

STM32WB55Rx STM32WB55RC, STM32WB55RE, STM32WB55RG

STM32WB55Vx STM32WB55VC, STM32WB55VE, STM32WB55VG

STM32WB35Cx STM32WB35CC, STM32WB35CE

Table 2. Device variants

Reference

Silicon revision codes

Device marking

(1)

REV_ID

(2)

STM32WB55Cx/Rx/Vx

Y 0x2001

STM32WB35Cx A 0x2001

1. Refer to the device datasheet for how to identify this code on different types of package.

2. REV_ID[15:0] bitfield of DBGMCU_IDCODE register.

STM32WB55xx/STM32WB35Cx device errata

STM32WB55Cx STM32WB55Rx

STM32WB55Vx STM32WB35Cx

Errata sheet

ES0394 - Rev 8 - May 2021

For further information contact your local STMicroelectronics sales office.

www.st.com

1 Summary of device errata

The following table gives a quick reference to the STM32WB55xx/STM32WB35Cx device limitations and their

status:

A = workaround available

N = no workaround available

P = partial workaround available

Applicability of a workaround may depend on specific conditions of target application. Adoption of a workaround

may cause restrictions to target application. Workaround for a limitation is deemed partial if it only reduces the

rate of occurrence and/or consequences of the limitation, or if it is fully effective for only a subset of instances on

the device or in only a subset of operating modes, of the function concerned.

Table 3. Summary of device limitations

Function Section Limitation

Status

STM32WB55Cx/Rx/Vx

Rev. Y

STM32WB35Cx

Rev. A

Core 1

2.1.1 Interrupted loads to SP can cause erroneous behavior

A A

2.1.2

VDIV or VSQRT instructions might not complete correctly when very short

ISRs are used

A A

2.1.3

Store immediate overlapping exception return operation might vector to

incorrect interrupt

A A

System

2.2.1 LSI2 not usable as RF low-power clock P P

2.2.2 Unstable LSI1 when it clocks RTC or CSS on LSE P P

2.2.3

Internal voltage reference corrupted upon Stop mode entry with

temperature sensing enabled

A A

2.2.4 Full JTAG configuration without NJTRST pin cannot be used A A

2.2.5

Auto-incrementing feature of the debug port cannot span more than

1 Kbyte

A A

2.2.6 PC13 signal transitions disturb LSE N -

2.2.7 Wrong DMAMUX synchronization and trigger input connections to EXTI A A

2.2.8

Incomplete Stop 2 mode entry after a wakeup from debug upon EXTI line

48 event

A A

2.2.9 Flash OPTVERR flag is always set after system reset A A

2.2.10

Overwriting with all zeros a Flash memory location previously

programmed with all ones fails

N N

2.2.11 WLCSP100 RF BLE overconsumption N -

2.2.12 WLCSP100 noise coupling in LDO configuration at specific conditions P -

2.2.13

FLASH_ECCR corrupted upon reset or power-down occurring during

Flash memory program or erase operation

A A

STM32WB55Cx STM32WB55Rx STM32WB55Vx STM32WB35Cx

Summary of device errata

ES0394 - Rev 8

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