DS882 (v1.2) December 17, 2020 www.xilinx.com
Product Specification 1
General Description
The radiation tolerant (RT) XQR UltraScale™ architecture-based devices extend the benefit of commercial
silicon with unique ceramic column grid array package, tested to stringent qualification flows like Xilinx®
class B, class Y test flows (QML compliant), full M-grade operating temperature range support, and
radiation tested for single-event effects.
XQR Kintex® UltraScale FPGAs are high-performance monolithic FPGAs with a focus on performance.
High DSP and block RAM-to-logic ratios and next-generation transceivers combined with space-grade
packaging to handle vibration and handling requirements during launch and operation enable a new
generation of high-density FPGAs for on-orbit reconfiguration, targeted for applications like on-board
processing, digital payloads, remote sensing, and many more. The Xilinx Space Secure Site provides access
to design guidelines and resources specific to space applications.
This data sheet is part of an overall set of documentation on the UltraScale architecture-based devices
available on the Xilinx website at www.xilinx.com/documentation.
Summary of Radiation Characteristics for Kintex UltraScale
XQRKU060 Devices
This product is intended for use in space environments and offered in Xilinx class Y, class B manufacturing
and process flows. Xilinx 20 nm UltraScale device technology is developed with innovative configuration
memory and block RAM design for single-event upset (SEU) mitigation, with optimized SEU design rules
and strategic implementation of SEU enhanced cells. The Kintex UltraScale XQRKU060 device uses more
than 40 proprietary, patented circuit design and layout techniques to reduce the SEU cross-section.
Block RAM includes embedded error detection and correction (EDAC) for high-performance SEU
mitigation.
Radiation Tolerant Kintex UltraScale
XQRKU060 FPGA Data Sheet
DS882 (v1.2) December 17, 2020
Product Specification
Table 1: Radiation Characteristics
Symbol Description Min Typ Max Units
TID Total Ionizing Dose (GEO) - 100 120 Krad (Si)
SEL Single-Event Latch-Up Immunity
(1)
-80-MeV-cm
2
/mg
SEU
CRAM
Single-Event Upset in Configuration RAM
(GEO)
(2)(3)
- 9.5e-9 - Upset/bit/day
SEU
BRAM
Single-Event Upset in Block RAM (GEO)
(2)(3)
- 2.3e-8 - Upset/bit/day
Radiation Tolerant Kintex UltraScale XQRKU060 FPGA Data Sheet
DS882 (v1.2) December 17, 2020 www.xilinx.com
Product Specification 2
Weibull Fit Parameters
Weibull curves were fitted to the measured test data. See the radiation test summary data in the radiation
reports in the XQRKU060 area of the Xilinx Space Secure Site. A summary of the best fit Weibull
parameters for the various components of the XQRKU060 FPGA is shown in Tabl e 3.
SEFI
CRAM
Single-Event Functional Interrupt Orb ital
Upset Frequency - Configuration RAM
(GEO)
(2)(3)
- 4.5e-4 - Upsets/device/day
Notes:
1. SEL immunity at maximum recommended operating voltage and junction temperature.
2. Error bar is ±40% at 90% confidence interval.
3. GEO estimate is based on CREME96 orbital models for worst-case conditions (solar minimum) and 100 mils of Al shielding.
Table 2: Single Event Effect Type Descriptions
Single Event Effect (SEE) Type SEE Signature Target/Comments
Single Event Upset (SEU)
Corruption of the information stored in
a memory element
Memories, latches in logic dev ices .
Composed of single bit upset (SBU) or
multiple bit upset (MBU).
Single Event Transient (SET)
Impulse response of certain amplitude
and duration
Analog and mixed-signal circuits.
Can lead to SEU if latched in memory
cell.
Single Event Latchup (SEL) High-current conditions
CMOS devices.
Might lead to hard failure.
Single Event Functional
Interrupt (SEFI)
Corruption of a datapath leading to loss
of normal operation
Complex devices with built-in state
machine/control sections or systems.
Table 3: Weibull Fit Parameters
Parameter LET
th
WS
sat
Configuration RAM 0.5 5 1.3 8.00E-10
Block RAM 0.9 2 0.98 9.60E-10
Shift Registers 1.16120.921.00E-03
Counter 1.16 6 0.96 4.00E-04
DSP 1.16 6 0.93 7.00E-04
GTH 1.16 2 0.96 2.00E-05
IOB 0.9 5 0.97 5.00E-04
PLL 1 3 0.92 1.00E-05
MMCM 1 3 0.92 1.00E-05
Table 1: Radiation Characteristics (Cont’d)
Symbol Description Min Typ Max Units