Technical Overview
Keysight Technologies
Power Electronics Device Modeling
02 | Keysight | Power Electronics Device Modeling - Technical Overview
Power Electronics Device Modeling
Power Electronics (PE) design engineers are under strong schedule pressure to address the
growing needs of power conversion, motor drivers, etc. Meanwhile, to enable smaller designs,
the switching frequencies are going up into the 100s of kHz and even low MHz. While these
might be modest frequencies, the voltages, and in particular, the changes in voltages versus
time (dV/dt) are very large. GaN devices today are switching within 250 ps, generating
harmonic content into the GHz range. Inductances as small as 0.1 nH can reshape the
waveforms driving the gate, causing ringing and transient induced noise. Stray inductance in
the high current path is very common, leading to large L*di/dt.
These surges in voltage and current, along with the ringing that follows can cause circuit
malfunction, and in some cases, circuit explosion. The high switching frequencies and
associated harmonics lead to undesirable electromagnetic interference.
These are big problems that need to be simulated and resolved. On the one hand, designers
may improve reliability by using larger power modules, but this leads to increased cost and size.
On the other hand, smaller nimbler devices must be simulated to predict voltage and current
surge issues. Modern power converters are now increasingly digitally controlled, with arrays of
discrete power devices placed side-by-side. To capture a transient over-voltage of a device, the
question arises: How can we model this?”
Many PE designers simply give up, relying instead on their decades of experience making
circuits work on the lab bench. Designs are therefore iterative, with managers planning small
changes between hardware releases. R&D budgets can swell due to longer than expected
design cycles. Even worse, the design team loses its edge on the competition.
4.5 4.6 4.7 4.8 4.9
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5.1 5.2 5.3 5.4 5.5
Time (µSec)
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0
5
10
15
20
Volts
2
3
4
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8
Time Domain Measurements on Half-Bridge Circuit with SiC MOSFETs
Low gate drive
High gate drive
Half-bridge midpoint/40
Inductor current
Amps
Voltage
Temperature