1. FEATURES
We declare that the material of product compliance with
RoHS requirements and Halogen Free.
S- prefix for automotive and other applications requiring
unique site and control change requirements; AEC-Q101
qualified and PPAP capable.
Extremely Fast Switching Speed
Low Forward Voltage — 0.35 V (Typ) @ IF = 10 Ma
2. DEVICE MARKING AND ORDERING INFORMATION
3. MAXIMUM RATINGS(Ta = 25ºC)
4. THERMAL CHARACTERISTICS
Total Device Dissipation,
FR−5 Board (Note 1) @ TA = 25ºC
Derate above 25ºC
Thermal Resistance,
Junction–to–Ambient
Junction and Storage temperature
LBAT54XV2T1G
S-LBAT54XV2T1G
Schottky Barrier Diode
Device Marking Shipping
LBAT54XV2T1G JV 3000/Tape&Reel
Reverse Voltage VR 30 V
Parameter Symbol Limits Unit
LBAT54XV2T3G JV 10000/Tape&Reel
Parameter Symbol Limits
PD
200
mW
1.57 mWC
RΘJA 635
ºC/W
Unit
TJ,Tstg −40+125
ºC
SOD523(SC-79)
Leshan Radio Company, LTD. Rev.C Jun. 2018 1/4
2
ANODE
1
CATH ODE
1. FR–5 = 1.0×0.75×0.062 in.
LBAT54XV2T1G, S-LBAT54XV2T1G
Schottky Barrier Diode
5. ELECTRICAL CHARACTERISTICS (Ta= 25ºC )
Reverse Breakdown Voltage
(IR = 10 µA)
Total Capacitance
(VR = 1.0 V, f = 1.0 MHz)
Reverse Leakage
(VR = 25 V)
Forward voltage
(IF =0.1mA)
(IF =1mA)
(IF =10mA)
(IF =30mA)
(IF =100mA)
Reverse Recovery Time
(IF = IR = 10 mA, IR(REC) = 1.0 mA)
Forward Current (DC)
Repetitive Peak Forward Current
Non–Repetitive Peak Forward Current (t < 1.0 s)
Typ.
Max. Unit
VBR V
30 - -
Characteristic
Symbol Min.
CT pF
- - 10
IR µA
- 0.5 2
0.4
- 0.41 0.5
- 0.52 1
VF V
- 0.22 0.24
- 0.29 0.32
- 0.35
trr nS
- - 5
IF - - 200 mA
IFRM - - 300 mA
IFSM - - 600 mA
Leshan Radio Company, LTD. Rev.C Jun. 2018 2/4
Notes: 1. A 2.0 k variable resistor adjusted for a Forward Current (I
F
) of 10 mA.
Notes: 2. Input pulse is adjusted so I
R(peak)
is equal to 10 mA.
Notes: 3. t
p
»
t
rr
+10 V
2 k
820
0.1
µ
F
DUT
V
R
100
µ
H
0.1
µ
F
50
OUTPUT
PULSE
GENERATOR
50
INPUT
SAMPLING
OSCILLOSCOPE
t
r
t
p
t
10%
90%
I
F
I
R
t
rr
t
i
R(REC)
= 1 mA
OUTPUT PULSE
(I
F
= I
R
= 10 mA; measured
at i
R(REC)
= 1 mA)
I
F
INPUT SIGNAL
RECOVERY TIME EQUIVALENT TEST CIRCUIT