This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at http://www.sgs.com/en/Terms-and-Conditions.aspx
and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at https://www.sgs.com/en/terms-and-conditions/terms-e-document. Attention is
drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s
findings at the time of its intervention only and within the limits of client’s instruction, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties
to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced, except in full, without prior written approval of the
Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.
Unless otherwise stated the results shown in this test report refer only to the sample(s) tested.
25, W u Chyuan 7 th Road, Ne w Taipei Indus trial Park, W u Ku Dis tric t, Ne w Taipei C ity, Taiw an / 新北市五股區新北產業園區五權��路 25 號
Member of the SGS Group
頁數(Page): 1 of 13
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:
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2019/09/18
2019/09/18 to 2019/09/25
測試結果(Test Results) ：
測試期間(Testing Period)
收件日期(Sample Receiving Date)
SMD POWER INDUCTOR
TMPB、TMPC、TMPA、TMPF、SLPI、SMPI、EPI(ePI)、VMPI、MLPI、TBMA、TMPV、
TMHC、TMLR SERIES
樣品名稱(Sample Description)
請參閱下一頁 (Please refer to following pages).
號碼(No.) : CE/2019/93096 日期(Date) : 2019/09/25
測試報告
Test Report
樣品型號(Style/Item No.)
西北臺慶科技股份有限公司 / TAI-TECH ADVANCED ELECTRONICS CO., LTD.
(臺慶精密電子(昆山)有限公司 / TAI-TECH ADVANCED ELECTRONICS (KUN-SHAN) CO., LTD.)
(慶邦電子元器件 (泗洪) 有限公司 / TAIPAQ ELECTRONICS (SI-HONG) CO., LTD.)
桃園市楊梅區幼獅工業區幼四路1號 / NO. 1, YOU 4TH ROAD, YOUTH INDUSTRIAL DISTRICT, YANG-MEI, TAO-YUAN CITY,
TAIWAN, R. O. C.
(江蘇省昆山市篷朗昆嘉高科技工業區郭澤路 / GUO-ZE ROAD, KUNJIA HI-TECH INDUSTRIAL PARK, KUN-SHAN, JIANG-SU, CHINA)
(中國，江蘇省，宿遷市，泗洪縣，經濟開發區杭州路南側，建設北路東側 / THE SOUTH HANGZHOU ROAD AND THE EAST JIANSHE
ROAD，ECONOMIC DEVELOPMENT ZONE，SIHONG COUNTY，SUQIANCITY，JIANGSU PROVINCE，P,R，CHINA)
以下測試樣品係由申請廠商所提供及確認 (The following sample(s) was/were submitted and identified by/on
behalf of the applicant as)：
For Question Please
Contact with SGS
www.sgs.com.tw
Signature Not Verified
This document is issued by the Company subject to its General Conditions of Service printed overleaf, available on request or accessible at http://www.sgs.com/en/Terms-and-Conditions.aspx
and, for electronic format documents, subject to Terms and Conditions for Electronic Documents at https://www.sgs.com/en/terms-and-conditions/terms-e-document. Attention is
drawn to the limitation of liability, indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s
findings at the time of its intervention only and within the limits of client’s instruction, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties
to a transaction from exercising all their rights and obligations under the transaction documents. This document cannot be reproduced, except in full, without prior written approval of the
Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law.
Unless otherwise stated the results shown in this test report refer only to the sample(s) tested.
25, W u Chyuan 7 th Road, Ne w Taipei Indus trial Park, W u Ku Dis tric t, Ne w Taipei C ity, Taiw an / 新北市五股區新北產業園區五權七路 25 號
Member of the SGS Group
頁數(Page): 2 of 13
號碼(No.) : CE/2019/93096 日期(Date) : 2019/09/25
測試報告
Test Report
西北臺慶科技股份有限公司 / TAI-TECH ADVANCED ELECTRONICS CO., LTD.
(臺慶精密電子(昆山)有限公司 / TAI-TECH ADVANCED ELECTRONICS (KUN-SHAN) CO., LTD.)
(慶邦電子元器件 (泗洪) 有限公司 / TAIPAQ ELECTRONICS (SI-HONG) CO., LTD.)
桃園市楊梅區幼獅工業區幼四路1號 / NO. 1, YOU 4TH ROAD, YOUTH INDUSTRIAL DISTRICT, YANG-MEI, TAO-YUAN CITY,
TAIWAN, R. O. C.
(江蘇省昆山市篷朗昆嘉高科技工業區郭澤路 / GUO-ZE ROAD, KUNJIA HI-TECH INDUSTRIAL PARK, KUN-SHAN, JIANG-SU, CHINA)
(中國，江蘇省，宿遷市，泗洪縣，經濟開發區杭州路南側，建設北路東側 / THE SOUTH HANGZHOU ROAD AND THE EAST JIANSHE
ROAD，ECONOMIC DEVELOPMENT ZONE，SIHONG COUNTY，SUQIANCITY，JIANGSU PROVINCE，P,R，CHINA)
：
No.1
2 n.d.
2 n.d.
2 n.d.
8 n.d.
- n.d.
5 n.d.
5 n.d.
5 n.d.
5 n.d.
5 n.d.
5 n.d.
5 n.d.
5 n.d.
5 n.d.
5 n.d.
mg/kg
mg/kg
九溴聯苯 / Nonabromobiphenyl
mg/kg
十溴聯苯 / Decabromobiphenyl
mg/kg
六溴聯苯 / Hexabromobiphenyl
mg/kg
mg/kg
多溴聯苯總和 / Sum of PBBs
二溴聯苯 / Dibromobiphenyl
mg/kg
一溴聯苯 / Monobromobiphenyl
mg/kg
測試項目
(Test Items)
單位
(Unit)
MDL
測試方法
(Method)
鉛 / Lead (Pb) mg/kg
八溴聯苯 / Octabromobiphenyl
整體混測 (MIXED ALL PARTS)
測試結果(Test Results)
測試部位(PART NAME)No.1
七溴聯苯 / Heptabromobiphenyl
mg/kg
三溴聯苯 / Tribromobiphenyl
mg/kg
四溴聯苯 / Tetrabromobiphenyl
mg/kg
五溴聯苯 / Pentabromobiphenyl
mg/kg
汞 / Mercury (Hg) mg/kg
六價鉻 / Hexavalent Chromium Cr(VI)
參考IEC 62321-4:2013+ AMD1:2017，以
感應耦合電漿發射光譜儀檢測. / With
reference to IEC 62321-4:2013+
AMD1:2017 and performed by ICP-OES.
參考IEC 62321-7-2 (2017)，以UV-VIS檢
測. / With reference to IEC 62321-7-
2 (2017) and performed by UV-VIS.
參考IEC 62321-6 (2015)，以氣相層析/
質譜儀檢測. / With reference to IEC
62321-6 (2015) and performed by
GC/MS.
參考IEC 62321-5 (2013)，以感應耦合電
漿發射光譜儀檢測. / With reference
to IEC 62321-5 (2013) and performed
by ICP-OES.
鎘 / Cadmium (Cd) mg/kg
結果
(Result)