4/13/2009
RELIABILITY MONITOR REPORT
FOR
SVL 1.2µm Silicon Gate CMOS
MAXIM In tegr ated Pr oducts
120 San Gabriel Dr.
Sunnyvale, CA 94086
This Report was prepared by
Maxim Reliability Engineering
Summary:
The data in the tables that follow w as generated as the result of an on-going Process Reliability
Monitor. The specific products in this process monitor are:
The calculated failure rate for devices using this process is:
The reliability data follows and in this section is the detailed reliabil ity data by stress. The reliability
data section includes the latest data available. This report covers data between
and .
10/1/2007
9/30/2008
The parameters used to calculate this failure rate are as follows:
Cf:60% Ea:0.7 Tu:25
°C
Process Descrip tion: SVL 1.2µm Silicon Gate CMOS
Proces s Information:
MAX1082AEUE MAX1082AEUE MAX1082AEUE
OPERATING LIFE
DESCRIPTION READPOINTCONDITION QUANTITY FAILSDATE
CODE
TEST
VEHICLE
LOT
NO.
1000135C 80 0HIGH TEM P OP LIFE HRS0601 MAX1082AEUE N4DCBA012I#
0Total:
STORAGE LIFE
DESCRIPTION READPOINTCONDITION QUANTITY FAILSDATE
CODE
TEST
VEHICLE
LOT
NO.
1000150C 45 0STORAGE LIFE HRS0649 MAX1082AEUE+ S4DCCQ001F#
0Total:
TEMPERATURE CYCLE
DESCRIPTION READPOINTCONDITION QUANTITY FAILSDATE
CODE
TEST
VEHICLE
LOT
NO.
1000-65C TO 150C 78 0TEMP CYCLE , 5' RAMP,
10' DWELL
CYS0649 MAX1082AEUE+ S4DCCQ001F#
0Total:
TEMPERATURE HUMIDITY BIAS
DESCRIPTION READPOINTCONDITION QUANTITY FAILSDATE
CODE
TEST
VEHICLE
LOT
NO.
96130C, 85% R.H. 33 0BIASED MOISTURE HRS0601 MAX1082AEUE N4DCBA012I#
96130C, 85% R.H. 33 0BIASED MOISTURE HRS0649 MAX1082AEUE+ S4DCCQ001F#
0Total:
UNBIASED MOISTURE RESISTANCE
DESCRIPTION READPOINTCONDITION QUANTITY FAILSDATE
CODE
TEST
VEHICLE
LOT
NO.
100130C, 85% R.H. 80 0MOISTURE SOA K HRS0601 MAX1082AEUE N4DBA012I#
96130C, 85% R.H. 80 0MOISTURE SOA K HRS0649 MAX1082AEUE+ S4DCCQ001F#
0Total: