Reliability Qualification Report
for
SDR SDRAM with Pb/Halogen Free
(Industrial)
(32M
×
8, 38nm SDRAM
AS4C32M8SA-6TIN)
Issued Date: Jun 20, 2017
CONTENTS
0. RELIABILITY TEST SUMMARY…………….……………...…..…………….…..1
1. INTRODUCTION ............................................................................................2
2. PRODUCT INFORMATION............................................................................2
3. RELIABILITY ..................................................................................................2
3.1. Sample Preparation Flow......................................................................2
3.2. Life Test ................................................................................................3
3.2.1. Test Flow...................................................................................3
3.2.2. Test Criteria...............................................................................3
3.2.3. Failure Rate Calculation and Test Result..................................4
3.3. Environmental Test...............................................................................6
3.3.1. Test Flow...................................................................................7
3.3.2. Test Condition and Time ...........................................................7
3.3.3. Test Criteria and Result...........................................................11
3.4. ESD Test.............................................................................................11
3.5. Latch-Up Test......................................................................................12
4. CONCLUSION..............................................................................................12