Conclusion:
The following qualification successfully meets the quality and reliability standards required of all
Maxim Integrated products:
MA
X
79356
In addition, Maxim Integrated's continuous reliability monitor program ensures that all outgoing
product will continue to meet Maxim's quality and reliability standards. The current status of the
reliability monitor program can be viewed at http://www.maximintegrated.com/qa/reliability/monitor.
Device Descriptio n:
A description of this device can be found in the product data sheet. You can find the product data
sheet at http://www.maximintegrated.com/search/parts.mvp.
Reliability Derating:
The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that
are temperature accelerated.
AfT = exp((Ea/k)*(1/Tu - 1/Ts)) = tu/ts
AfT = Acceleration factor due to Temperature
tu = Time at use temperature (e.g. 55°C)
ts = Time at stress temperature (e.g. 125°C)
k = Boltzmann’s Constant (8.617 x 10-5 eV/°K)
Tu = Temperature at Use (°K)
Ts = Temperature at Stress (°K)
Ea = Activation Energy (e.g. 0.7 ev)
The activation energy of the failure mechanism is derived from either internal studies or industry
accepted standa rds, or acti vation energy of 0.7ev will be used whenever actu al failure
mechanisms or their activation energies are unknown. All deratings will be done from the stress
ambient temperature to th e use ambie nt temperature.
An exponential model will be used to determine the acceleration factor fo r failure mechanisms,
which are voltage accelerated.
AfV = exp(B*(Vs - Vu))
AfV = Acceleration f actor due to Voltage
Vs = Stress Voltage (e.g. 7.0 volts)
Vu = Maximum Operating Voltage (e.g. 5.5 volts)
B = Constant related to failure mechanism ty pe (e.g. 1.0, 2.4, 2.7, etc.)
The Constant, B, related to the failure mechanism is derived from either internal studies or industry
accepted standards, or a B of 1.0 will be used whenever actual failure mechanisms or their B are
unknown. All deratings will be done from the stress voltage to the maximum o perating voltage.
Failure rate data from the operating life test is reported using a Chi- Squared sta tisti cal model at the
60% or 90% confid ence leve l (Cf ).
The failure rate, Fr, is related to the acceleration during lif e test by:
Fr = X/(ts * AfV * AfT * N * 2)
X = Chi-Sq statistical upper limit
N = Life test sample size