Using the Built-in Self-Test (BIST) on the MPC5744P
●The MPC5744P device targets chassis and safety applications which require a high Automotive Safety Integrity Level (SIL). All devices in this family are built around a safety concept based on delayed lock step, targeting an ISO26262 ASIL-D (Design) integrity level.
●A requirement of the standard is to detect the accumulation of latent defects. To meet this requirement, the MPC5744P has the ability to execute Built-In Self-Test (BIST) procedures.
●The BIST can be performed on the device’s embedded memories and logic.
●Additionally, there is "SafeAssure" Functional Safety program to reduce the development effort required by customers to meet ISO26262. As a part of this program, NXP provides an MPC5744P safety manual to advice users on how to configure the MPC5744P to obtain ISO26262 ASIL-D compliance.
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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June 2017 |
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Rev. 0 |
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AN11993 |
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320 KB |
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